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A Comprehensive Within-Subject Analysis of EEGNet for SEED-IV Emotion Recognition: Subject Variability and Per-Class Performance

Authors

  • Sujata Kulkarni KLE Technological University, Karnataka, Hubballi, India
  • Prakashgoud Patil KLE Technological University, Karnataka, Hubballi, India
Volume: 16 | Issue: 2 | Pages: 34403-34408 | April 2026 | https://doi.org/10.48084/etasr.17161

Abstract

This paper presents a comprehensive within-subject analysis of the EEGNet model's performance on the SEED-IV dataset for multi-class emotion recognition. This analysis accounts for the individual contributions of each of the 15 subjects by considering a standardized preprocessing procedure, subject-specific splitting of the data into training, validation, and test sets, and a trained model architecture and process for each subject to account for individual variability. Accuracy, precision, and recall of the model for each subject, as well as class-specific measures, were used to evaluate model performance for the differentiation of each emotion on the SEED-IV dataset, analyzing the amount of each emotion that the model can reproduce on the test dataset, presenting an accurate interpretation of the distance between classes by analyzing confusion matrices, as well as the capability of the model to differentiate learned emotions on the test dataset by means of the two-dimensional visualization of the learned features extracted by the model. The study presents three contributions: (i) subject clustering analysis, (ii) per-class recall analysis, and (iii) validation that the raw EEG waveform achieves competitive performance.

Keywords:

emotion recognition, EEGNet, SEED IV, brain computer interface

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References

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How to Cite

[1]
S. Kulkarni and P. Patil, “A Comprehensive Within-Subject Analysis of EEGNet for SEED-IV Emotion Recognition: Subject Variability and Per-Class Performance”, Eng. Technol. Appl. Sci. Res., vol. 16, no. 2, pp. 34403–34408, Apr. 2026.

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