Diaa, Uliyan. “A Deep Learning Model to Inspect Image Forgery on SURF Keypoints of SLIC Segmented Regions”. Engineering, Technology & Applied Science Research 14, no. 1 (February 8, 2024): 12549–12555. Accessed November 26, 2024. https://etasr.com/index.php/ETASR/article/view/6622.