DIAA, U. A Deep Learning Model to Inspect Image Forgery on SURF Keypoints of SLIC Segmented Regions. Engineering, Technology & Applied Science Research, Greece, v. 14, n. 1, p. 12549–12555, 2024. DOI: 10.48084/etasr.6622. Disponível em: https://etasr.com/index.php/ETASR/article/view/6622. Acesso em: 28 oct. 2024.