KARAKALOS, S. Growth Mode Study of MgCl2 on Ti (0001) and SiO2 under Ultra High Vacuum by XPS. Engineering, Technology & Applied Science Research, Greece, v. 2, n. 6, p. 291–294, 2012. DOI: 10.48084/etasr.231. Disponível em: https://etasr.com/index.php/ETASR/article/view/231. Acesso em: 30 jun. 2024.